부산대학교 도서관

Ferroelectric (Pb0.92La0.08)(Zr0.65Ti0.35)O3 (PLZT) film with good surface morphology and perovskite structure was grown in situ on quartz substrate by radio-frequency magnetron sputtering at 650 °C. The fundamental optical constants (the band gap energy, linear refractive index, and absorption coefficient) of the film are obtained by optical transmittance measurement. The third-order nonlinear optical properties of the films were investigated by the Z-scan technique. The magnitude and sign of the nonlinear refractive index n2 were determined, as was the negative sign, which indicated a self-defocusing optical nonlinearity. A large nonlinear refractive index as high as 1.21×10-6 esu is displayed in the film. All results show that PLZT ferroelectric thin film has potential applications in nonlinear optical devices. [ABSTRACT FROM AUTHOR]