학술논문

Evaluation method of high-permittivity materials in microwave region using coplanar waveguide.
Document Type
Article
Source
Electronics & Communications in Japan, Part 2: Electronics. Mar2007, Vol. 90 Issue 3, p17-25. 9p. 5 Diagrams, 3 Charts, 12 Graphs.
Subject
*WAVEGUIDES
*PLANAR transistors
*BOUNDARY scan testing
*MICROWAVE amplifiers
*MICROWAVE devices
*DIELECTRICS
*MICROWAVE attenuation
*ELECTRIC equipment
Language
ISSN
8756-663X
Abstract
This paper proposes a novel evaluation method for dielectric characteristics of ceramic substrates made of high-permittivity material, (Ba, Sr)TiO3 (BST), in the microwave region. The dielectric characteristics are obtained accurately and simply by measuring S-parameter and by full-wave analysis for coplanar waveguide (CPW) composed on the substrate. Only the measurement of S21 response of the CPW is required for evaluation. The effective permittivity (ℇeff) and attenuation constant (α) are calculated from the S21 data. Relative permittivity (ℇr) and tanδ of substrate material are estimated by relating the ℇeff and α quantitatively with their simulated values calculated by the Extended Spectral Domain Approach (ESDA) taking the thickness effect of the conductor into consideration. Three kinds of BST substrates with different Ba to Sr ratios were measured as test samples. The estimated ℇr's of Ba0.3Sr0.7TiO3, Ba0.5Sr0.5TiO3, and Ba0.7Sr0.3TiO3 were 662, 1650, and 4450, respectively. These ℇr's decrease slightly as the frequency increases. The estimated errors for the ℇr's are estimated to be less than 0.3%. This method is useful for the evaluation even of a small variation of dielectric constant in high-permittivity materials. © 2007 Wiley Periodicals, Inc. Electron Comm Jpn Pt 2, 90(3): 17–25, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/ecjb.20296 [ABSTRACT FROM AUTHOR]