부산대학교 도서관

Methods for processing optical emission spectroscopy data in the study of the region of interaction between helium plasma with a density of the main gas [He] ≈ 1012–1014 cm–3 and electrons ne ≈ 1011–1013 cm–3 and a tungsten sample in a PLM facility designed for testing materials with a plasma load are presented. A method for measuring the electron temperature using the coronal approximation is proposed. For the calculation, it is necessary to choose the ratio of the intensities of spectral lines that is most sensitive to the electron temperature; in this case, this is the ratio of the intensity of ionic lines to atomic lines. Comparison of the ratio of the experimental intensities of the He II 468.5 nm ion line and a number of He I atomic lines with well-known electron excitation constants with the calculated dependence of this ratio on the mean electron energy is a reliable method for the spectral determination of the electron temperature of a magnetized rarefied helium plasma. In experiment, the concentration of atomic helium is [He] ≈ 1014 cm–3; the discharge current is 2–10 A; the voltage drop is 160–180 V; the radius and length of the discharge are 16 and 370 mm, respectively. The electron temperature measured using two singlet and two triplet lines of He I is Te = 2.4 ± 0.2 eV. With consideration of the nonlocality of the electron energy distribution function (EEDF), the complex nature of the drift and diffusion of charges in crossed and inhomogeneous electric and magnetic fields, etc., the mean electron energy of = (3/2)kTe ≈ 3.6 eV corresponding to this temperature can be considered a lower estimate for the energy of the Maxwellian section of the EEDF of the plasma. [ABSTRACT FROM AUTHOR]