학술논문
Narrow-beam X-ray tests of CCD edge response.
Document Type
Article
Author
Source
Subject
*X-rays
*DARK energy
*CHARGE coupled devices
*GRAVITATIONAL lenses
*PIXELS
*COLLIMATORS
*WAVELENGTHS
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Language
ISSN
0922-6435
Abstract
The physical boundaries of a fully-depleted CCD can lead to distorted field lines and non-uniform response. We study this response with a beam of X-rays constrained to a width of less than one pixel (15 $\upmu$m), and a system to map the CCD response as a function of transverse position. [ABSTRACT FROM AUTHOR]