학술논문
Data management challenges in three-dimensional EM.
Document Type
Article
Author
Patwardhan, Ardan; Carazo, José-Maria; Carragher, Bridget; Henderson, Richard; Heymann, J Bernard; Hill, Emma; Jensen, Grant J; Lagerstedt, Ingvar; Lawson, Catherine L; Ludtke, Steven J; Mastronarde, David; Moore, William J; Roseman, Alan; Rosenthal, Peter; Sorzano, Carlos-Oscar S; Sanz-García, Eduardo; Scheres, Sjors H W; Subramaniam, Sriram; Westbrook, John; Winn, Martyn
Source
Subject
*ADULT education workshops
*INFORMATION resources management conferences
*ELECTRON microscopy
*IMAGE segmentation
*DATABASE management
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Language
ISSN
1545-9993
Abstract
The authors discuss aspects of the outcome of the Data Management Challenges in 3D Electron Microscopy (DMCEM) workshop in Great Britain on December 5-6, 2011. They say that the workshop consisted of presentation of data-management solutions and initiatives, as well as the discussion on segmentation, validation and tomography. They mention that the EMDataBank will lead the effort to improve standards for 3DEM validation.