학술논문

Dielectric and X-ray Diffraction Analysis of Ba(Ga,Ta) 0.05 Ti 0.90 O 3.
Document Type
Article
Source
Ferroelectrics. Nov2014, Vol. 473 Issue 1, p13-23. 11p.
Subject
*X-ray diffraction
*SUBSTITUTION reactions
*PERMITTIVITY
*PHASE transitions
*GRAIN size
*SCANNING electron microscopy
Language
ISSN
0015-0193
Abstract
Ba(Ga,Ta)0.05Ti0.90O3, a B-site dipole-like substituted material is investigated for structural phase transitions over the temperature range 30 to 900°C using x-ray diffraction. Rietveld refinement of the data suggests the material to be Pmm (cubic) from 200 to 900°C, P4/mmm (tetragonal) from 30 to 200°C with phases similar to those of BaTiO3[12]. Average grain size determined using scanning electron microscopy is 650 nm. Measurements of dielectric properties from −50 to 120°C and over a frequency range of 10 Hz to 2 MHz show a relatively flat dielectric constant that is electric-field tunable indicating that Ba(Ga,Ta)0.05Ti0.90O3is a reasonable candidate for frequency agile components. [ABSTRACT FROM AUTHOR]