학술논문
Bending and reverse bending during the fabrication of novel GaAs/(In,Ga)As/GaAs core–shell nanowires monitored by in situ x-ray diffraction.
Document Type
Article
Author
Source
Subject
*NANOWIRES
*X-ray diffraction
*ENERGY dispersive X-ray spectroscopy
*AUDITING standards
*ELECTRON energy loss spectroscopy
*GALLIUM arsenide
*TRANSMISSION electron microscopes
*
*
*
*
*
*
Language
ISSN
0957-4484
Abstract
We report on the fabrication of a novel design of GaAs/(In,Ga)As/GaAs radial nanowire heterostructures on a Si 111 substrate, where, for the first time, the growth of inhomogeneous shells on a lattice mismatched core results in straight nanowires instead of bent. Nanowire bending caused by axial tensile strain induced by the (In,Ga)As shell on the GaAs core is reversed by axial compressive strain caused by the GaAs outer shell on the (In,Ga)As shell. Progressive nanowire bending and reverse bending in addition to the axial strain evolution during the two processes are accessed by in situ by x-ray diffraction. The diameter of the core, thicknesses of the shells, as well as the indium concentration and distribution within the (In,Ga)As quantum well are revealed by 2D energy dispersive x-ray spectroscopy using a transmission electron microscope. Shell(s) growth on one side of the core without substrate rotation results in planar-like radial heterostructures in the form of free standing straight nanowires. [ABSTRACT FROM AUTHOR]