학술논문
Structure of Strained Low‐Dimensional Sb by In Situ Surface X‐Ray Diffraction.
Document Type
Article
Source
Subject
*X-ray diffraction
*THIN films
*SURFACE roughness
*ATOMIC structure
*TOPOLOGICAL property
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Language
ISSN
0370-1972
Abstract
Antimony ultrathin films in tensile strain are grown on InAs(111)B substrates and studied in situ using surface X‐ray diffraction. The detailed atomic structures of two highly crystalline Sb(0001) films are derived, with thicknesses of 19 and 4 bilayers. Features considered in structural modeling include interfacial intermixing, surface roughness, individual layer relaxations, and rotational twin domains (RTDs). The four‐bilayer film shows significant structural relaxation in every layer, while both films include RTDs. The results are discussed in relation to the topological properties of low‐dimensional Sb. [ABSTRACT FROM AUTHOR]