학술논문
Transmission electron microscopy sample preparation technique for sintered alloys.
Document Type
Article
Source
Subject
*ELECTRONS
*POWDER metallurgy
*ALLOYS
*MICROSCOPY
*
*
*
Language
ISSN
0032-5899
Abstract
Powder metallurgy alloys are typically inhomogeneous with a significant amount of porosity. This complicates conventional transmission electron microscopy sample preparation. However, the use of focused ion beam milling allows site specific transmission electron microscopy samples to be prepared in a short amount of time. This paper presents a method that can be used to produce transmission electron microscopy samples from an Al-Cu-Mg PM alloy. [ABSTRACT FROM AUTHOR]