학술논문

Reduced temperature growth of crystalline 3C-SiC films on 6H-SiC by chemical vapor deposition from silacyclobutane.
Document Type
Article
Source
Journal of Applied Physics. 7/15/1995, Vol. 78 Issue 2, p1271. 3p. 1 Chart, 3 Graphs.
Subject
*EPITAXY
*SPECTROPHOTOMETRY
*THIN films
*SEMICONDUCTORS
Language
ISSN
0021-8979
Abstract
Provides information on a study which investigated 3C- on 6H-SiC (0001) epitaxial growth from the single-source organosilane precursor silacylobutane (c-C[sub3]H[sub6]SiH[sub2]). Use of spectrophotometry; Features of the 3C-SiC thin films determined using double crystal X-ray diffractometry; Semiconductor material for various high temperature and high power electron devices.