학술논문

Investigation of the thermal degradation of the silicon field-emission cathode as a two-phase system.
Document Type
Article
Source
Russian Microelectronics. Dec2012, Vol. 41 Issue 7, p387-392. 6p.
Subject
*CATHODES
*COMPUTER simulation
*TEMPERATURE
*SURFACE tension
*FIELD emission cathodes
Language
ISSN
1063-7397
Abstract
The factors affecting the thermal degradation of a single silicon field-emission pointed cathode during the take-off of the emission current are described experimentally. The results of the numerical modeling of the temperature dynamics of the field-emission cathode in conditions of the presence of a free interface between the liquid and solid phases allowing for the surface tension are described. [ABSTRACT FROM AUTHOR]