학술논문
Birefringence measurements in low-T[sub g] photorefractive materials by means of electro-optic...
Document Type
Article
Author
Source
Subject
*PHOTOREFRACTIVE materials
*ELLIPSOMETRY
*OPTICAL diffraction
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Language
ISSN
0021-9606
Abstract
Presents a novel evaluation method of frequency dependent ellipsometric measurement of the maximum achievable diffraction efficiency of organic photorefractive materials. Identification of the phase shift between the alternating electric field and the detected signal; Error estimation of the value of birefringence coefficients.