학술논문
Electrostatic Friction Force on an AFM Probe Moving Near a Sample Surface.
Document Type
Article
Author
Source
Subject
*ATOMIC force microscopy
*ELECTROSTATIC fields
*ELECTRODYNAMICS
*ENERGY dissipation
*SUBSTRATES (Materials science)
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Language
ISSN
1063-7842
Abstract
Abstract: Within the framework of nonrelativistic electrodynamics, general formulas have been obtained for the tangential dissipative force of electrostatic friction and the normal attraction force of an axially symmetric probe moving parallel to a smooth surface of homogeneous substrates or substrates coated with thin films upon various combinations of materials. As a numerical example, the interaction of a metal sphere moving above a metal surface has been studied. The calculation results are compared with the available experimental and theoretical results of other authors. [ABSTRACT FROM AUTHOR]