학술논문

The influence of TSD (topographic standard deviation) and RH (refference height) test/retest variability upon the test/retest variability of the HRT stereometric parameters.
Document Type
Article
Source
Acta Ophthalmologica (1755375X). Sep2012 Supplement S249, Vol. 90, p0-0. 1p.
Subject
*STANDARD deviations
*OPTIC disc
*STATISTICAL correlation
*LINEAR statistical models
*GLAUCOMA
Language
ISSN
1755-375X
Abstract
Purpose To investigate the role of TSD and RH inter‐test variability upon the variability of the stereometric parametres. Methods 204 glaucomatous patients underwent regularly complete ophthalmological follow‐up for 3 years and HRT3 exam (yearly). The exclusion criteria were optic disc or retinal pathology that might interfere with the detection of glaucoma progression, TSD >30μm and progression of glaucomatous defect on optic disc photography or TCA. Results TSD inter‐test variability <27; no statistically significant correlation between TSD variability and stereometric parameters changes. RH variability ranged between ‐198 and 187. Correlation analyses revealed a linear dependence between the inter‐test variability of RH and stereometric parameters change. The most powerful correlations were observed for: RNFL Thickness (r=0.756, p<0.001), Rim Area (r=0.662, p<0.001), C/D Area Ratio (r=‐0.663, p<0.001). The least correlated were Height Variation Contour (r=0.31) and Cup Shape Measure (r=0.07, p=0.3). When RH variability did not exceed 25μm, the correlations with stereometric parameters change were not statistically significant (for Rim Area, r=0.21, p>0.05, for C/D Area Ratio, r=‐0.13, p=0.22, for RNFL Thickness r=0.06, p=0.52). Conclusion At TSD <30, the impact of TSD variability upon stereometric parameters changes is of little relevance. For values >25μm, the variability of the RH is a major factor determining test/retest variability for RNFL Thickness, Rim Area, C/D Area, Rim Volume and Linear C/D. Inter‐test variability of RH <25μm is an important criterion for the clinical relevance of stereometric parameters changes. [ABSTRACT FROM AUTHOR]