학술논문
Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2 O3 dielectric layers.
Document Type
Article
Author
Source
Subject
*PASSIVATION
*SECOND harmonic generation
*DIELECTRICS
*CALIBRATION
*SEMICONDUCTORS
*ALUMINUM oxide
*
*
*
*
*
Language
ISSN
0021-8979
Abstract
Optical second harmonic generation (SHG) can be employed to characterize the passivation quality of semiconducting material interfaces. The interface electric field (EDC) related to the existing charges at and near the interface, including the fixed oxide charges Qox, gives rise to the electric field induced second harmonic phenomenon. In this paper, we calibrate the SHG response for EDC measurement, using Al2O3/SiO2/Si(100) samples with different Qox. To perform this calibration, SHG and capacitance-voltage measurements (to access the electrical field of the samples) were made. The experimental results match well the simulated calibration curve, proving the potential of the SHG as stand-alone characterization technique for dielectric stacks on Si. [ABSTRACT FROM AUTHOR]