학술논문

SECURITY ASSESSMENT OF NONVOLATILE MEMORY AGAINST PHYSICAL PROBING.
Document Type
Article
Source
Electronic Device Failure Analysis. Nov2022, Vol. 24 Issue 4, p22-32. 9p.
Subject
*NONVOLATILE memory
*FLASH memory
*RANDOM access memory
*SPIN-polarized currents
*SCANNING transmission electron microscopy
Language
ISSN
1537-0755
Abstract
The article presents a detailed and methodical discussion about how existing and emerging memory devices can fall prey to attacks through various physical modalities. It discusses the attacking capabilities of physical modalities, threat models and assumptions; developing a framework of metrics for quantitatively assessing the vulnerability of nonvolatile memory cells to different physical attacks and discuss potential countermeasures against physical attacks, at design and package levels.