학술논문
High resolution x-ray characterization of Co films on Al2O3.
Document Type
Article
Author
Source
Subject
*MOLECULAR beam epitaxy
*THIN films
*X-ray scattering
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Language
ISSN
0021-8979
Abstract
Presents a study which analyzed the structural properties of molecular beam epitaxy-grown thin cobalt (Co) films on sapphire substrates by high resolution x-ray scattering measurements. Regimes distinguished for the detailed analysis of the x-ray scattering cross-section; Description of the scattering methods; Outline of x-ray reflectivity and thin film Bragg scattering; Reflectivity measurements from Co films.