학술논문
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'학술논문'
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Academic Journal
Kamogashira T; Department of Otolaryngology, JR Tokyo General Hospital, Tokyo, JPN.; Arimoto K; Department of Otolaryngology, JR Tokyo General Hospital, Tokyo, JPN.; Kishimoto M; Department of Otolaryngology, JR Tokyo General Hospital, Tokyo, JPN.; Miyano K; Department of Otolaryngology, JR Tokyo General Hospital, Tokyo, JPN.; Ishimoto S; Department of Otolaryngology, JR Tokyo General Hospital, Tokyo, JPN.
Publisher: Cureus, Inc Country of Publication: United States NLM ID: 101596737 Publication Model: eCollection Cited Medium: Print ISSN: 2168-8184 (Print) Linking ISSN: 21688184 NLM ISO Abbreviation: Cureus Subsets: PubMed not MEDLINE
Academic Journal
IEEE Access Access, IEEE. 7:26810-26820 2019
Academic Journal
Emilia Vynnycky; Jennifer K. Knapp; Timos Papadopoulos; Felicity T. Cutts; Masahiko Hachiya; Shinsuke Miyano; Susan E. Reef
International Journal of Infectious Diseases, Vol 137, Iss , Pp 149-156 (2023)
Conference
2012 38th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE. :002101-002104 Jun, 2012
Conference
CCNC 2006. 2006 3rd IEEE Consumer Communications and Networking Conference, 2006. Consumer Communications and Networking Conference, 2006. CCNC 2006. 3rd IEEE. 2:844-848 2006
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Oishi, A.; Fujii, O.; Yokoyama, T.; Ota, K.; Sanuki, T.; Inokuma, H.; Eda, K.; Idaka, T.; Miyajima, H.; Iwasa, S.; Yamasaki, H.; Oouchi, K.; Matsuo, K.; Nagano, H.; Komoda, T.; Okayama, Y.; Matsumoto, T.; Fukasaku, K.; Shimizu, T.; Miyano, K.; Suzuki, T.; Yahashi, K.; Horiuchi, A.; Takegawa, Y.; Saki, K.; Mori, S.; Ohno, K.; Mizushima, I.; Saito, M.; Iwai, M.; Yamada, S.; Nagashima, N.; Matsuoka, F.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :229-232 2005
Conference
Okano, K.; Izumida, T.; Kawasaki, H.; Kaneko, A.; Yagishita, A.; Kanemura, T.; Kondo, M.; Ito, S.; Aoki, N.; Miyano, K.; Ono, T.; Yahashi, K.; Iwade, K.; Kubota, T.; Matsushita, T.; Mizushima, I.; Inaba, S.; Ishimaru, K.; Suguro, K.; Eguchi, K.; Tsunashima, Y.; Ishiuchi, H.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :721-724 2005
Academic Journal
IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 5(1):229-233 Jan, 2015
Conference
Inaba, S.; Nagano, H.; Miyano, K.; Mizushima, I.; Okayama, Y.; Nakauchi, T.; Ishimaru, K.; Ishiuchi, H.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) Custom integrated circuists Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004. :225-228 2004
Academic Journal
Khadka DB; Photovoltaic Materials Group, Center for GREEN Research on Energy and Environmental Materials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.; Shirai Y; Photovoltaic Materials Group, Center for GREEN Research on Energy and Environmental Materials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.; Sahara R; Computational Structural Materials Group, Research Center for Structural Materials, National Institute for Materials Science (NIMS), 1-2-1, Sengen, Tsukuba, Ibaraki, 305-0047, Japan.; Yanagida M; Photovoltaic Materials Group, Center for GREEN Research on Energy and Environmental Materials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.; Miyano K; Photovoltaic Materials Group, Center for GREEN Research on Energy and Environmental Materials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki, 305-0044, Japan.
Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE; PubMed not MEDLINE
Academic Journal
Watanabe, K.; Kim, B.; Inoue, T.; Sodabanlu, H.; Sugiyama, M.; Goto, M.; Hayashi, S.; Miyano, K.; Nakano, Y.
IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 4(4):1086-1090 Jul, 2014
Conference
Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT. Junction technology Junction Technology, 2002. IWJT. Extended Abstracts of the Third International Workshop on. :67-70 2002
Academic Journal
Tomoya Isobe; Masatoshi Takagi; Aiko Sato-Otsubo; Akira Nishimura; Genta Nagae; Chika Yamagishi; Moe Tamura; Yosuke Tanaka; Shuhei Asada; Reina Takeda; Akiho Tsuchiya; Xiaonan Wang; Kenichi Yoshida; Yasuhito Nannya; Hiroo Ueno; Ryo Akazawa; Itaru Kato; Takashi Mikami; Kentaro Watanabe; Masahiro Sekiguchi; Masafumi Seki; Shunsuke Kimura; Mitsuteru Hiwatari; Motohiro Kato; Shiro Fukuda; Kenji Tatsuno; Shuichi Tsutsumi; Akinori Kanai; Toshiya Inaba; Yusuke Shiozawa; Yuichi Shiraishi; Kenichi Chiba; Hiroko Tanaka; Rishi S. Kotecha; Mark N. Cruickshank; Fumihiko Ishikawa; Tomohiro Morio; Mariko Eguchi; Takao Deguchi; Nobutaka Kiyokawa; Yuki Arakawa; Katsuyoshi Koh; Yuki Aoki; Takashi Ishihara; Daisuke Tomizawa; Takako Miyamura; Eiichi Ishii; Shuki Mizutani; Nicola K. Wilson; Berthold Göttgens; Satoru Miyano; Toshio Kitamura; Susumu Goyama; Akihiko Yokoyama; Hiroyuki Aburatani; Seishi Ogawa; Junko Takita
Nature Communications, Vol 13, Iss 1, Pp 1-16 (2022)
Conference
Hokazono, A.; Ohuchi, K.; Takayanagi, M.; Watanabe, Y.; Magoshi, S.; Kato, Y.; Shimizu, T.; Mori, S.; Oguma, H.; Sasaki, T.; Yoshimura, H.; Miyano, K.; Yasutake, N.; Suto, H.; Adachi, K.; Fukui, H.; Watanabe, T.; Tamaoki, N.; Toyoshima, Y.; Ishiuchi, H.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :639-642 2002
Conference
Inaba, S.; Miyano, K.; Hokazono, A.; Ohuchi, K.; Mizushima, I.; Oyamatsu, H.; Tsunashima, Y.; Toyoshima, Y.; Ishiuchi, H.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :659-662 2002
Academic Journal
Okamura K; Department of Dermatology, Faculty of Medicine, Yamagata University, Yamagata, Japan.; Saito T; Department of Dermatology, Faculty of Medicine, Yamagata University, Yamagata, Japan.; Oiso N; Department of Dermatology, Kindai University Nara Hospital, Ikoma, Japan.; Sekiguchi A; Department of Dermatology, Gunma University Graduate School of Medicine, Maebashi, Japan.; Motegi SI; Department of Dermatology, Gunma University Graduate School of Medicine, Maebashi, Japan.; Hara Y; Department of Dermatology, Jichi Medical University, Shimotsuke, Japan.; Department of Dermatology, St. Marianna University School of Medicine, Kawasaki, Japan.; Komine M; Department of Dermatology, Jichi Medical University, Shimotsuke, Japan.; Kudo K; Department of Dermatology, Fukuoka Children's Hospital, Fukuoka, Japan.; Noguchi A; Department of Dermatology and Allergology, Juntendo University Graduate School of Medicine, Tokyo, Japan.; Oshimo T; Department of Dermatology, Graduate School of Medicine, Osaka Metropolitan University, Osaka, Japan.; Shibuya M; Department of Dermatology, Kyoto University Graduate School of Medicine, Kyoto, Japan.; Miyano K; Department of Dermatology, Saitama Medical University, Saitama, Japan.; Hoshina T; Department of Pediatrics, School of Medicine, University of Occupational and Environmental Health, Japan, Kitakyushu, Japan.; Itokawa M; Department of Pediatrics, Hino Municipal Hospital, Hino, Japan.; Masui Y; Department of Dermatology, Hamamatsu University School of Medicine, Hamamatsu, Japan.; Otaki K; Department of Dermatology, Jichi Medical University Saitama Medical Center, Saitama, Japan.; Hozumi Y; Department of Dermatology, Faculty of Medicine, Yamagata University, Yamagata, Japan.; Suzuki T; Department of Dermatology, Faculty of Medicine, Yamagata University, Yamagata, Japan.
Publisher: Blackwell Munksgaard Country of Publication: England NLM ID: 101318927 Publication Model: Print Cited Medium: Internet ISSN: 1755-148X (Electronic) Linking ISSN: 17551471 NLM ISO Abbreviation: Pigment Cell Melanoma Res Subsets: MEDLINE
Conference
Extended Abstracts of the Second International Workshop on Junction Technology. IWJT. (IEEE Cat.No.01EX541C) Junction technology Junction Technology, 2001. IWJT. Extended Abstracts of the Second International Workshop on. :83-86 2001
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[검색어] MIYANO, K
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