학술논문
'학술논문'
에서 검색결과 83건 | 목록
1~10
Conference
Butaud, E.; Laroche, T.; Barec, V.; Clairet, A.; Bousquet, M.; Bernard, F.; Caulmilone, R.; Michoulier, E.; Courjon, E.; Huyet, I.; Tavel, B.; Aspar, G.; Lami, Y.; Desfrane, A.; Raveski, A.; Ballandras, S.; Didier, C.
2020 50th European Microwave Conference (EuMC) Microwave Conference (EuMC), 2020 50th European. :654-657 Jan, 2021
Conference
Butaud, E.; Ballandras, S.; Bousquet, M.; Drouin, A.; Tavel, B.; Huyet, I.; Clairet, A.; Bertrand, I.; Ghorbel, A.; Reinhardt, A.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :34.6.1-34.6.4 Dec, 2020
Academic Journal
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Sabouret, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Biénacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouiller, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
In Solid State Electronics 2006 50(4):573-578
Academic Journal
Martinez, F.; Leyris, C.; Neau, G.; Valenza, M.; Hoffmann, A.; Vildeuil, J.C.; Vincent, E.; Boeuf, F.; Skotnicki, T.; Bidaud, M.; Barge, D.; Tavel, B.
In Microelectronic Engineering 17 June 2005 80:54-57
Conference
Difrenza, R.; Rochereau, K.; Devoivre, T.; Tavel, B.; Duriez, B.; Roy, D.; Jullian, S.; Dezzani, A.; Boulestin, R.; Stolk, P.; Arnaud, F.
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :137-142 2005
Conference
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Saboure, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Bienacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouille, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :423-426 2005
Conference
Duriez, B.; Morin, P.; Tavel, B.; Froment, B.; Gouraud, P.; Roy, D.; Rochereau, K.; Difrenza, R.; Margin, A.; Denais, M.; Bidaud, M.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :197-200 2004
Conference
Harrison, S.; Coronel, P.; Cros, A.; Cerutti, R.; Leverd, F.; Beverina, A.; Wacquez, R.; Bustos, J.; Delille, D.; Tavel, B.; Barge, D.; Bienacel, J.; Samson, M.P.; Martin, F.; Maitrejean, S.; Munteanu, D.; Autran, J.L.; Skotnicki, T.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :291-294 2004
Conference
Boeuf, F.; Arnaud, F.; Basso, M.T.; Sotta, D.; Wacquant, F.; Rosa, J.; Bicais-Lepinay, N.; Bernard, H.; Bustos, J.; Manakli, S.; Gaillardin, M.; Grant, J.; Skotnicki, T.; Tavel, B.; Duriez, B.; Bidaud, M.; Gouraud, P.; Chaton, C.; Morin, P.; Todeschini, J.; Jurdit, M.; Pain, L.; De-Jonghe, V.; El-Farhane, R.; Jullian, S.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :425-428 2004
Conference
Duriez, B.; Tavel, B.; Boeuf, R.; Basso, M.T.; Laplanche, Y.; Ortolland, C.; Reber, D.; Wacquant, R.; Morin, P.; Lenoble, D.; Palla, R.; Bidaud, M.; Barge, D.; Dachs, C.; Brut, H.; Roy, D.; Marin, M.; Payet, F.; Cagnat, N.; Difrenza, R.; Rochereau, K.; Denais, M.; Stolk, P.; Woo, M.; Arnaud, F.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :847-850 2004
검색 결과 제한하기
제한된 항목
[AR] Tavel, B.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어