학술논문
'학술논문'
에서 검색결과 7건 | 목록
1~10
Conference
Breuil, L.; El Hajjam, G. K.; Ramesh, S.; Ajaykumar, A.; Arreghini, A.; Zhang, L.; Sebaai, F.; Nyns, L.; Raymaekers, T.; Rosmeulen, M.; Van den Bosch, G.; Furnemont, A.
2020 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2020 IEEE International. :1-4 May, 2020
Conference
Ramesh, S.; Palayam, S. Vadakupudhu; Rosseel, E.; Arreghini, A.; Kunert, B.; Baryshnikova, M.; Zhang, L.; Ong, P.; Teugels, L.; Pak, M.; Jossart, N.; Raymaekers, T.; Stiers, J.; Van den Bosch, G.; Furnemont, A.
2019 IEEE 11th International Memory Workshop (IMW) Memory Workshop (IMW), 2019 IEEE 11th International. :1-4 May, 2019
Conference
Tan, C.-L.; Lavizzari, S.; Blomme, P.; Breuil, L.; Vecchio, G.; Sebaai, F.; Paraschiv, V.; Tao, Z.; Schepers, B.; Nyns, L.; Peter, A.; Dekkers, H.; Ong, P.; Tsvetanova, D.; Devriendt, K.; Teugels, L.; Heylen, N.; Raymaekers, T.; Jossart, N.; Mennella, P.; Delhougne, R.; V-Palayam, S.S.; Arreghini, A.; Van den bosch, G.; Furnemont, A.
2017 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2017 IEEE International. :1-4 May, 2017
Conference
Delhougne, R.; Arreghini, A.; Rosseel, E.; Hikavyy, A.; Vecchio, E.; Zhang, L.; Pak, M.; Nyns, L.; Raymaekers, T.; Jossart, N.; Breuil, L.; V-Palayam, S. S.; Tan, C.-L.; Van den bosch, G.; Furnemont, A.
2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :203-204 Jun, 2018
Academic Journal
In: Frontiers in Built Environment . (Frontiers in Built Environment, 22 May 2020, 6)
Conference
Florent, K.; Groeseneken, G.; Van Houdt, J.; Lavizzari, S.; Di Piazza, L.; Popovici, M.; Potoms, G.; Raymaekers, T.
In: European Solid-State Device Research Conference , 2017 47th European Solid-State Device Research Conference, ESSDERC 2017. (European Solid-State Device Research Conference, 12 October 2017, :164-167)
Conference
Lorusso, G.F.; Sutani, T.; Horiguchi, N.; Bömmels, J.; Wilson, C.J.; Briggs, B.; Tan, C.L.; Raymaekers, T.; Delhougne, R.; Van Den Bosch, G.; Di Piazza, L.; Kar, G.S.; Furnémont, A.; Fantini, A.; Donadio, G.L.; Souriau, L.; Crotti, D.; Yasin, F.; Appeltans, R.; Rao, S.; De Simone, D.; Rincon Delgadillo, P.; Leray, P.; Charley, A.-L.; Zhou, D.; Veloso, A.; Collaert, N.; Ohashi, T.; Yamaguchi, A.; Inoue, O.; Hasumi, K.; Koshihara, S.; Ikota, M.; Okagawa, Y.; Ishimoto, T.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10145)
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[AR] Raymaekers, T.
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