학술논문
'학술논문'
에서 검색결과 87건 | 목록
1~10
Academic Journal
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(8):8162-8168 Apr, 2023
Conference
Jaud, M. -A.; Vandendaele, W.; Rrustemi, B.; Viey, A. G.; Martin, S.; Le Royer, C.; Vauche, L.; Martinie, S.; Morvan, E.; Gwoziecki, R.; Modica, R.; Iucolano, F.; Plissonnier, M.; Poiroux, T.
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2021 33rd International Symposium on. :319-322 May, 2021
Academic Journal
Viey, A.G.; Vandendaele, W.; Jaud, M.; Gerrer, L.; Garros, X.; Cluzel, J.; Martin, S.; Krakovinsky, A.; Biscarrat, J.; Gwoziecki, R.; Plissonnier, M.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.; Ghibaudo, G.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):2017-2024 Apr, 2021
Conference
Viey, A.G.; Vandendaele, W.; Jaud, MA; Gwoziecki, R.; Torres, A.; Plissonnier, M.; Gaillard, F.; Ghibaudo, G.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019
Conference
Biscarrat, J.; Gwoziecki, R.; Baines, Y.; Buckley, J.; Gillot, C.; Vandendaele, W.; Garnier, G.; Charles, M.; Plissonnier, M.
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2018 IEEE 30th International Symposium on. :200-203 May, 2018
Conference
Vandendaele, W.; Lorin, T.; Gwoziecki, R.; Baines, Y.; Biscarrat, J.; Jaud, M.A.; Gillot, C.; Charles, M.; Plissonnier, M.; Reimbold, G.
2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :126-129 Sep, 2017
Conference
Jaud, M.-A.; Baines, Y.; Charles, M.; Morvan, E.; Scheiblin, P.; Torres, A.; Plissonnier, M.; Barbe, J.-C.
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on. :113-116 Sep, 2017
Conference
Lorin, T.; Van Den Daele, W.; Gillot, C.; Charles, M.; Biscarrat, J.; Plissonnier, M.; Ghibaudo, G.; Reimbold, G.
2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-4 Mar, 2017
Conference
Viey, A. G.; Vandendaele, W.; Jaud, M.-A.; Gerrer, L.; Garros, X.; Cluzel, J.; Martin, S.; Krakovinsky, A.; Biscarrat, J.; Gwoziecki, R.; Plissonnier, M.; Gaillard, F.; Modica, R.; Iucolano, F.; Meneghini, M.; Meneghesso, G.; Ghibaudo, G.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :23.6.1-23.6.4 Dec, 2020
Conference
Vandendaele, W.; Martin, S.; Jaud, M.-A; Krakovinsky, A.; Vauche, L.; Le Royer, C.; Biscarrat, J.; Viey, A. G.; Gwoziecki, R.; Modica, R.; Iucolano, F.; Plissonnier, M.; Gaillard, F.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :23.5.1-23.5.4 Dec, 2020
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[AR] Plissonnier, M.
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