학술논문
'학술논문'
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Conference
Chin, A.; Laio, C.C.; Chen, C.; Chiang, K.C.; Yu, D.S.; Yoo, W.J.; Samudra, G.S.; Wang, T.; Hsieh, I.J.; McAlister, S.P.; Chi, C.C.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :158-161 2005
Conference
Yu, D.S.; Chin, A.; Laio, C.C.; Lee, C.F.; Cheng, C.F.; Chen, W.J.; Zhu, C.; Li, M.-F.; Yoo, W.J.; McAlister, S.P.; Kwong, D.L.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :181-184 2004
Conference
Yu, D.S.; Chin, A.; Laio, C.C.; Lee, C.F.; Cheng, C.F.; Chen, W.J.; Zhu, C.; Li, M.-F.; Yoo, W.J.; McAlister, S.P.; Kwong, D.L.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p181-184, 4p
Conference
Chin, A.; Laio, C.C.; Chen, C.; Chiang, K.C.; Yu, D.S.; Yoo, W.J.; Samudra, G.S.; Wang, T.; Hsieh, I.J.; McAlister, S.P.; Chi, C.C.
In: Technical Digest - International Electron Devices Meeting, IEDM , IEEE International Electron Devices Meeting, 2005 IEDM - Technical Digest. (Technical Digest - International Electron Devices Meeting, IEDM, 2005, 2005:158-161)
Conference
Yu, D.S.; Laio, C.C.; Lee, C.F.; Cheng, C.F.; Chin, A.; Zhu, C.; Li, M.-F.; Yoo, W.J.; Chen, W.J.; McAlister, S.P.; Kwong, D.L.
In: Technical Digest - International Electron Devices Meeting, IEDM , Technical Digest - IEEE International Electron Devices Meeting, 2004 IEDM (50th Annual Meeting). (Technical Digest - International Electron Devices Meeting, IEDM, 2004, :181-184)
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제한된 항목
[AR] Laio, C.C.
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