학술논문
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Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Hody, H.; Dekkers, H.; van Setten, M. J.; Chasin, A.; Sharifi, S.H.; Sutar, S.; Magnarin, L.; Celano, U.; Puliyalil, H.; Kundu, S.; Pak, M.; Teugels, L.; Tsvetanova, D.; Bazzazian, N.; Vandersmissen, K.; Biasotto, C.; Batuk, D.; Geypen, J.; Heijlen, J.; Delhougne, R.; Kar, G. S.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :292-293 Jun, 2022
Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control
Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Hody, H.; Dekkers, H.; van Setten, M. J.; Chasin, A.; Sharifi, S.H.; Banerjee, K.; Puliyalil, H.; Kundu, S.; Pak, M.; Tsvetanova, D.; Bazzazian, N.; Vandersmissen, K.; Batuk, D.; Geypen, J.; Heijlen, J.; Delhougne, R.; Kar, G. S.
2022 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2022 International Conference on. :88-88 Sep, 2022
Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Delhougne, R.; Banerjee, K.; Donadio, G. L.; Dekkers, H.; van Setten, M. J.; Puliyalil, H.; Mao, M.; Kundu, S.; Pak, M.; Teugels, L.; Tsvetanova, D.; Bazzazian, N.; Klijs, L.; Hody, H.; Chasin, A.; Heijlen, J.; Goux, L.; Kar, G. S.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Belmonte, A.; Oh, H.; Subhechha, S.; Rassoul, N.; Hody, H.; Dekkers, H.; Delhougne, R.; Ricotti, L.; Banerjee, K.; Chasin, A.; van Setten, M. J.; Puliyalil, H.; Pak, M.; Teugels, L.; Tsvetanova, D.; Vandersmissen, K.; Kundu, S.; Heijlen, J.; Batuk, D.; Geypen, J.; Goux, L.; Kar, G. S.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :10.6.1-10.6.4 Dec, 2021
Conference
Vega-Gonzalez, V.; Puliyalil, H.; Versluijs, J.; Lesniewska, A.; Varela-Pereira, O.; Baert, R.; Paolillo, S.; Decoster, S.; Schleicher, F.; Montero, D.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Teugels, L.; Heylen, N.; Jourdan, N.; El-Mekki, Z.; van der Veen, M.; Ciofi, I.; Briggs, B.; Heijlen, J.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Demonie, I.; Lazzarino, F.; Ercken, M; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Jaysankar, M.; Wilson., C.; Muroch, G.; Tokei, Z.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :20.5.1-20.5.4 Dec, 2020
Academic Journal
In: Electrochemical and Solid-State Letters . (Electrochemical and Solid-State Letters, 2007, 10(10):G76-G79)
Academic Journal
In: Electrochemical and Solid-State Letters . (Electrochemical and Solid-State Letters, 2007, 10(11):7)
Periodical
Electrochemical and Solid State Letters; November 2007, Vol. 10 Issue: 11
Periodical
Electrochemical and Solid State Letters; October 2007, Vol. 10 Issue: 10
Academic Journal
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제한된 항목
[AR] Heijlen, J.
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