학술논문
'학술논문'
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Large scale energy labelling with models: The EU TABULA model versus machine learning with open data
Academic Journal
In: Energy . (Energy, 1 February 2023, 264)
Report
Sabbagh, D.; Thomas, N.; Torres, J.; Pillarisetty, R.; Amin, P.; George, H. C.; Singh, K.; Budrevich, A.; Robinson, M.; Merrill, D.; Ross, L.; Roberts, J.; Lampert, L.; Massa, L.; Amitonov, S.; Boter, J.; Droulers, G.; Eenink, H. G. J.; van Hezel, M.; Donelson, D.; Veldhorst, M.; Vandersypen, L. M. K.; Clarke, J. S.; Scappucci, G.
Phys. Rev. Applied 12, 014013 (2019)
Academic Journal
In: Land Use Policy . (Land Use Policy, December 2021, 111)
Conference
Clarke, J. S.; Thomas, N.; Roberts, J.; Pilliarisetty, R.; Yoscovits, Z.; Caudillo, R.; George, H.; Singh, K. J.; Michalak, D.; Amin, P.; Mei, A.; Bruno, A.; Poletto, S.; Boter, J.; Droulers, G.; Kalhor, N.; Samkharadze, N.; Dehollain, J. P.; Yeoh, L.; Sammak, A.; Scappucci, G.; Veldhorst, M.; DiCarlo, L.; Vandersypen, L. M. K.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :13.1.1-13.1.3 Dec, 2016
Academic Journal
van Oort, T.; Jernudd, Å.; Lotze, K.; Dibeltulo, S.; Porubcanska, T.; Gennari, D.T.; van de Vijver, L.; Pafort-Overduin, C.; Biltereyst, D.; Boter, J.; Ercole, P.; Meers, P.
In: Research Data Journal for the Humanities and Social Sciences . (Research Data Journal for the Humanities and Social Sciences, 2020, 5(2):109-125)
Academic Journal
In: International Journal of Production Research . (International Journal of Production Research, 2 November 2017, 55(21):6453-6469)
Academic Journal
In: International Journal of Operations and Production Management . (International Journal of Operations and Production Management, 6 June 2016, 36(6):710-731)
Conference
Feng, Y.; Xuan, P.; Wu, D.; Yang, B.; Xu, C.; Liu, N.; Izikson, P.; Chen, C.; Verstraeten, B.; Wang, A.; Sanguinetti, G.; Miceli, G.; Boter, J.; Van Der Meijden, V.; Li, H.; Mozooni, B.; You, H.; Yan, X.-Z.; Markov, V.; Chai, Y.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Academic Journal
In: Journal of the Operational Research Society . (Journal of the Operational Research Society, October 2013, 64(10):1505-1516)
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[AR] Boter, J.
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