학술논문
'학술논문'
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Academic Journal
Betti Beneventi, G.; Perniola, L.; Sousa, V.; Gourvest, E.; Maitrejean, S.; Bastien, J.C.; Bastard, A.; Hyot, B.; Fargeix, A.; Jahan, C.; Nodin, J.F.; Persico, A.; Fantini, A.; Blachier, D.; Toffoli, A.; Loubriat, S.; Roule, A.; Lhostis, S.; Feldis, H.; Reimbold, G.; Billon, T.; De Salvo, B.; Larcher, L.; Pavan, P.; Bensahel, D.; Mazoyer, P.; Annunziata, R.; Zuliani, P.; Boulanger, F.
In Solid State Electronics November-December 2011 65-66:197-204
Conference
Betti Beneventi, G.; Gourvest, E.; Fantini, A.; Perniola, L.; Sousa, V.; Maitrejean, S.; Bastien, J.C.; Bastard, A.; Fargeix, A.; Hyot, B.; Jahan, C.; Nodin, J.F.; Persico, A.; Blachier, D.; Toffoli, A.; Loubriat, S.; Roule, A.; Lhostis, S.; Feldis, H.; Reimbold, G.; Billon, T.; De Salvo, B.; Larcher, L.; Pavan, P.; Bensahel, D.; Mazoyer, P.; Annunziata, R.; Boulanger, F.
2010 IEEE International Memory Workshop Memory Workshop (IMW), 2010 IEEE International. :1-4 May, 2010
Conference
In: BIO Web of Conferences , 44th World Congress of Vine and Wine, OIV 2023. (BIO Web of Conferences, 6 December 2023, 68)
Blockchain: No pain, no gain? An examination of blockchain technology in the vitivinicultural sector
Conference
In: BIO Web of Conferences , 44th World Congress of Vine and Wine, OIV 2023. (BIO Web of Conferences, 6 December 2023, 68)
Academic Journal
Perniola, L.; Sousa, V.; Fantini, A.; Arbaoui, E.; Bastard, A.; Armand, M.; Fargeix, A.; Jahan, C.; Nodin, J.-F.; Persico, A.; Blachier, D.; Toffoli, A.; Loubriat, S.; Gourvest, E.; Betti Beneventi, G.; Feldis, H.; Maitrejean, S.; Lhostis, S.; Roule, A.; Cueto, O.; Reimbold, G.; Poupinet, L.; Billon, T.; De Salvo, B.; Bensahel, D.; Mazoyer, P.; Annunziata, R.; Zuliani, P.; Boulanger, F.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 31(5):488-490 May, 2010
Conference
Sandhya, C.; Bastard, A.; Perniola, L.; Bastien, J.C.; Toffoli, A.; Henaff, E.; Roule, A.; Persico, A.; Hyot, B.; Sousa, V.; De Salvo, B.; Reimbold, G.
2012 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2012 IEEE International. :6C.3.1-6C.3.5 Apr, 2012
Conference
Fantini, A.; Sousa, V.; Perniola, L.; Gourvest, E.; Bastien, JC; Maitrejean, S.; Braga, S.; Pashkov, N.; Bastard, A.; Hyot, B.; Roule, A.; Persico, A.; Feldis, H.; Jahan, C.; Nodin, JF; Blachier, D.; Toffoli, A.; Reimbold, G.; Fillot, F.; Pierre, F.; Annunziata, R.; Benshael, D.; Mazoyer, P.; Vallee, C.; Billon, T.; Hazart, J.; De Salvo, B.; Boulanger, F.
2010 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2010 IEEE International. :29.1.1-29.1.4 Dec, 2010
Academic Journal
In Annales médico-psychologiques 2009 167(1):57-65
Academic Journal
Bastard, A.; Alexandre, H.; Guzzo, J.; Weidmann, S.; Coelho, C.; Gougeon, R.; Briandet, R.; Canette, A.
In: Frontiers in Microbiology . (Frontiers in Microbiology, 27 April 2016, 7(APR))
Conference
Sinquin, J.-C.; Bastard, A.; Beaufort, E.; Buisson, B.; Casier, O.; Gervais, M.; Groëninck, D.; Krol, H.; Landureau, C.; Leroux, S.; Michel, L.; Moreau, A.; Morin, P.; Pagès, H.; Palomo, R.; Roux, B.; Vaillant, S.; Wehrlé, R.
In: Optics InfoBase Conference Papers , Adaptive Optics: Analysis, Methods and Systems, AOMS 2020. (Optics InfoBase Conference Papers, 2020)
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[AR] Bastard, A.
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