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Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems
Conference
Pieper, N.J.
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Chun, M.
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Xiong, Y.
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Dattilo, H.M.
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Kronenberg, J.
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Baeg, S.
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Wen, S.-J.
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Fung, R.
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Chan, D.
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2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024
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Radiation reliability benefit of area-optimized interleaved flip-flop layout in 28 nm technology
Academic Journal
Jeon, Sang Hoon
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Lim, C.
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Baeg, S.
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Wen, S.
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Wang, H.
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Chen, L.
In
Microelectronics Reliability
September 2019 100-101
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DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity
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Waqar, M.
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IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 13(1):70-78 Jan, 2023
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Fault-Coping Algorithm for Improving Leader–Follower Swarm-Control Algorithm of Unmanned Surface Vehicles
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Lee, J.
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Jeong, S.
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Cho, H.
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Divulge of Root Cause Failure in Individual Cells of 2× nm Technology DDR4 DRAM at Operating Temperature
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Shahzadi, N.
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IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(5):2338-2345 May, 2022
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Estimation of the Trap Energy Characteristics of Row Hammer-Affected Cells in Gamma-Irradiated DDR4 DRAM
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Baeg, S.
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Yun, D.
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IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(3):558-566 Mar, 2022
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DDR4 Data Channel Failure Due to DC Offset Caused by Intermittent Solder Ball Fracture in FBGA Package
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Waqar, M.
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Bak, G.
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IEEE Access Access, IEEE. 9:63002-63011 2021
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Fault Coverage Re-Evaluation of Memory Test Algorithms With Physical Memory Characteristics
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Lee, K.
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Baeg, S.
IEEE Access Access, IEEE. 9:124632-124639 2021
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Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation
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Yun, D.
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Park, M.
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Bak, G.
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Baeg, S.
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IEEE Access Access, IEEE. 9:137514-137523 2021
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Failure Analysis of Galaxy S7 Edge Smartphone Using Neutron Radiation
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IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(11):2370-2381 Nov, 2020
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