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Academic Journal
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Sabouret, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Biénacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouiller, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
In Solid State Electronics 2006 50(4):573-578
Conference
In: IEEE International Reliability Physics Symposium Proceedings , 2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2024)
Conference
Moosa, M.; Haggag, A.; Liu, N.; Kalpat, S.; Kuffler, M.; Menke, D.; Abramowitz, P.; Ramon, M.E.; Tseng, H.H.; Luo, T.Y.; Lim, S.; Grudowski, P.; Jiang, J.; Min, B.W.; Weintraub, C.; Chen, J.; Wong, S.; Paquette, C.; Anderson, G.; Tobin, P.J.; White, B.E., Jr.; Mendicino, M.
2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :129-133 2005
Conference
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Saboure, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Bienacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouille, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :423-426 2005
Conference
Samavedam, S.B.; La, L.B.; Smith, J.; Dakshina-Murthy, S.; Luckowski, E.; Schaeffer, J.; Zavala, M.; Martin, R.; Dhandapani, V.; Triyoso, D.; Tseng, H.H.; Tobin, P.J.; Gilmer, D.C.; Hobbs, C.; Taylor, W.J.; Grant, J.M.; Hegde, R.I.; Mogab, J.; Thomas, C.; Abramowitz, P.; Moosa, M.; Conner, J.; Jiang, J.; Arunachalarn, V.; Sadd, M.; Nguyen, B.-Y.; White, B.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :433-436 2002
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 7(2):217-224 Jun, 2007
Conference
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :93-96 Apr, 2007
Conference
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :281-287 Apr, 2007
Academic Journal
Tseng, H.-H.; Jeon, Y.; Abramowitz, P.; Luo, T.-Y.; Hebert, L.; Lee, J.J.; Jiang, J.; Tobin, P.J.; Yeap, G.C.F.; Moosa, M.; Alvis, J.; Anderson, S.G.H.; Cave, N.; Chua, T.C.; Hegedus, A.; Miner, G.; Jeon, J.; Sultan, A.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 23(12):704-706 Dec, 2002
Conference
Tseng, H.-H.; Grant, J.M.; Hobbs, C.; Tobin, P.J.; Hebert, L.; Ramon, M.; Kalpat, S.; Wang, F.; Triyoso, D.; Gilmer, D.C.; White, B.E.; Abramowitz, P.; Moosa, M.; Luo, Z.; Ma, T.P.
IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech). VLSI Technology VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on. :132-133 2005
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제한된 항목
[AR] Abramowitz, P.
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