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Reciprocal space mapping and strain scanning using X-ray diffraction microscopy

Document Type

Article

Author

Poulsen, H.F.; Leemreize, H.; Pedersen, A.F.; Jakobsen, A.C.; Ormstrup, J.; Cook, P.K.; Yildirim, C.; Kutsal, M.; Detlefs, C.; Trujillo, J.X.

Source

In: Journal of Applied Crystallography. (Journal of Applied Crystallography, October 2018, 51(5):1428-1436)

Subject

Language

English

ISSN

16005767
00218898

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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