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Test Coverage in Microservice Systems: An Automated Approach to E2E and API Test Coverage Metrics

Document Type

Article

Author

Abdelfattah, A.S.; Yero, J.; Song, E.; Cerny, T.; Taibi, D.

Source

In: Electronics (Switzerland). (Electronics (Switzerland), May 2024, 13(10))

Subject

Language

English

ISSN

20799292

Online Access

Full Text (ProQuest Central) Full Text (Gale Academic Onefile) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

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