학술논문

1-Mbit 3-D DRAM Using a Monolithically Stacked Structure of a Si CMOS and Heterogeneous IGZO FETs
Document Type
Periodical
Source
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:236-242 2024
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Field effect transistors
Three-dimensional displays
Random access memory
Silicon
Electrodes
Leakage currents
Logic gates
Extremely low off-state current
heterogeneous OSFETs
monolithic stacking
oxide semiconductor (OS)
planar FET
vertical FET
1T1C
Language
ISSN
2168-6734
Abstract
We present a three-dimensional (3D) DRAM prototype, which is formed using oxide semiconductor FETs (OSFETs) monolithically stacked on a Si CMOS. The OSFETs are composed of a one-layer planar FET and two-layer vertical FETs (VFETs). The 1T1C memory cells in the VFET layers and a primary sense amplifier in the planar FET layer, which are formed using heterogeneous OSFETs, provide various circuit functions in the DRAM. The operation of the 3D DRAM in a 1-Mbit memory array is demonstrated for the first time. The results show that the proposed DRAM operates with read and write times of 60 ns and 50 ns, respectively. The leakage current of the memory cell is extremely low (comparable to an $2.2\times 10^{-19}$ A/cell at 85°C), indicating that over 99% of the data are retained in the memory array after one hour at 85°C without refresh.