학술논문

Defect related negative temperature coefficiency of short circuit current of Cu(In, Ga)Se2 solar cells
Document Type
Conference
Source
2011 37th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE. :001252-001254 Jun, 2011
Subject
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Power, Energy and Industry Applications
Engineered Materials, Dielectrics and Plasmas
Photovoltaic cells
Bismuth
Short circuit currents
Photonic band gap
Radiative recombination
Degradation
Silicon
Language
ISSN
0160-8371
Abstract
The negative temperature coefficient of the short circuit current of Cu(In, Ga)Se 2 solar cells, contrary to the positive one of Si cells, may cause more degradation of power conversion efficiency at high temperature than Si solar cells due to defects. Photoluminescence spectra show both donor-acceptor transition and band-impurity transition. At higher temperature, more unoccupied states of donors and acceptors yield relatively low luminescence intensity from the donor-acceptor-pair transition, and become efficient traps to capture photo-generated carriers. This reflects that both the short circuit current and the external quantum efficiency degrade at high temperature due to the donor and acceptor states.