학술논문
Influence of beam conditions and energy for SEE testing
Document Type
Conference
Author
Ferlet-Cavrois, V.; Schwank, J. R.; Liu, S.; Muschitiello, M.; Beutier, Th.; Javanainen, A.; Hedlund, A.; Poivey, C.; Zadeh, A.; Harboe-Sorensen, R.; Santin, G.; Nickson, B.; Menicucci, A.; Binois, C.; Peyre, D.; Hoeffgen, S. K.; Metzger, S.; Schardt, D.; Kettunen, H.; Virtanen, A.; Berger, G.; Piquet, B.; Foy, J.-C.; Zafrani, M.; Truscott, P.; Poizat, M.; Bezerra, F.
Source
2011 12th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on. :690-699 Sep, 2011
Subject
Language
ISSN
0379-6566
Abstract
The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.