학술논문

Laminar to turbulent flow transition measurements using an array of SOI-CMOS MEMS wall shear stress sensors
Document Type
Conference
Source
2008 IEEE Sensors Sensors, 2008 IEEE. :57-61 Oct, 2008
Subject
Signal Processing and Analysis
Components, Circuits, Devices and Systems
Sensor arrays
Fluid flow measurement
Stress measurement
Micromechanical devices
Thermal stresses
Biomembranes
Thermal sensors
Thermal conductivity
Temperature sensors
Cutoff frequency
Language
ISSN
1930-0395
Abstract
The successful utilization of an array of silicon on insulator complementary metal oxide semiconductor (SOICMOS) micro thermal shear stress sensors for flow measurements at macro-scale is demonstrated. The sensors use CMOS aluminum metallization as the sensing material and are embedded in low thermal conductivity silicon oxide membranes. They have been fabricated using a commercial 1 μm SOI-CMOS process and a post-CMOS DRIE back etch. The sensors with two different sizes were evaluated. The small sensors (18.5 × 18.5 μm 2 sensing area on 266 × 266 μm 2 oxide membrane) have an ultra low power (100 °C temperature rise at 6mW) and a small time constant of only 5.46 μs which corresponds to a cut-off frequency of 122 kHz. The large sensors (130 × 130 μm 2 sensing area on 500 × 500 μm 2 membrane) have a time constant of 9.82 μs (cut-off frequency of 67.9 kHz). The sensors’ performance has proven to be robust under transonic and supersonic flow conditions. Also, they have successfully identified laminar, separated, transitional and turbulent boundary layers in a low speed flow.