학술논문
Analysis of meteorite samples using PIXE technique.
Document Type
Article
Source
Subject
*PARTICLE induced X-ray emission
*METEORITE analysis
*ION beams
*ENVIRONMENTAL sampling
*INTEGRATED software
*
*
*
*
Language
ISSN
0236-5731
Abstract
A non-destructive approach to the sample treatment during the analytical process is one of the crucial advantages of the particle induced X-ray emission technique. Rare and precious environmental and space samples can be analyzed in order to evaluate concentrations of individual elements presented in specimens. A non-destructive analysis of two meteorite samples was carried out using 3 MeV protons incident in a narrow ion beam (1.5 mm diam.). GUPIXWIN software package was used for spectra evaluation. Concentrations of several elements (Fe, Ni, Cu and Zn) were determined and quantitative surface elemental distribution maps were constructed. [ABSTRACT FROM AUTHOR]