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Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium

Document Type

Journal

Author

Liu, Chao; Pan, Jie; Yuan, Qihui; Zhu, Chao; Liu, Jianquan; Ge, Feixiang; Zhu, Jijie; Xie, Haitao; Zhou, Dawei; Zhang, Zicheng; Zhao, Peiyi; Tian, Bobo; Huang, Wei; Wang, Lin

Source

ADVANCED MATERIALS; NOV 30 2023, 9p.

Subject

Language

English

ISSN

15214095

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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