학술논문 – 법학도서관

학술논문

replay검색결과 돌아가기

search검색화면

Reliability of medium blocking voltage power VDMOSFET in radiation environment

Document Type

Journal

Author

Velardi, F; Iannuzzo, F; Busatto, G; Wyss, J; Sanseverino, A; Candelori, A; Curro, G; Cascio, A; Frisina, F

Source

MICROELECTRONICS RELIABILITY; SEP-NOV 2003, 43 9-11, p1847-p1851, 5p.

Subject

Language

English

ISSN

1872941X

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

이메일