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Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES

Document Type

Article

Author

Schneider, C.M.; Wiemann, C.; Patt, M.; Feyer, V.; Plucinski, L.; Krug, I.P.; Escher, M.; Weber, N.; Merkel, M.; Renault, O.; Barrett, N.

Source

In Journal of Electron Spectroscopy and Related Phenomena October 2012 185(10):330-339

Subject

Language

ISSN

0368-2048

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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