학술논문
Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics
Document Type
Article
Author
Angarano, M.M; Beaumont, W; Biasini, M; Bilei, G.M; Brunetti, M.T; Checcucci, B; Civinini, C; Coughlan, J; Creanza, D; de Palma, M; Drouhin, F; Fanò, L; Fiore, L; French, M; Furtjes, A; Giassi, A; Giorgi, M; Gutleber, J; Hall, G; Lariccia, P; Loreti, M; Maggi, G; Mantovani, G; Marinelli, N; Mattig, P; Messina, G; My, S; Papi, A; Radicci, V; Raymond, M; Santinelli, R; Selvaggi, G; Servoli, L ; Silvestris, L; Tempesta, P; Tsirou, A; Verdini, P.G; Wittmer, B
Source
In Nuclear Inst. and Methods in Physics Research, A 2002 488(1):85-93
Subject
Language
ISSN
0168-9002