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Band bending at heterovalent interfaces: Hard X-ray photoelectron spectroscopy of GaP/Si(0 0 1) heterostructures

Document Type

Article

Author

Romanyuk, O.; Paszuk, A.; Bartoš, I.; Wilks, R.G.; Nandy, M.; Bombsch, J.; Hartmann, C.; Félix, R.; Ueda, S.; Gordeev, I.; Houdkova, J.; Kleinschmidt, P.; Machek, P.; Bär, M.; Jiříček, P.; Hannappel, T.

Source

In Applied Surface Science 1 November 2021 565

Subject

Language

ISSN

0169-4332

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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