학술논문
Assessment of metal implant induced artefacts using photon counting spectral CT
Document Type
Conference Paper
Author
Butler, A.P.H.; Butler, P.; Anjomrouz, M.; Atharifard, A.; Bell, S.T.; Chernoglazov, A.I.; De Ruiter, N.J.A.; Doesburg, R.M.N.; Goulter, B.P.; Healy, J.L.; Lansley, S.P.; Mandalika, V.B.H.; Moghiseh, M.; Panta, R.K.; Prebble, H.M.; Shamshad, M.; Vivek, V.S.; Walsh, M.F.; Dalefield, T.; Duncan, N.; Gieseg, S.; Alexander, S.D.; Hilton, P.J.; Chambers, C.; Kanithi, P.; Renaud, P.; Searle, E.; Uddin, R.; Vanden Broeke, L.; Wijesooriya, M.; Rajeswari Amma, M.; Raja, A.Y.; Bamford, B.; Walker, E.P.; Matanaghi, A.; Adebileje, S.A.; Anderson, N.; Asghariomabad, F.; Bheesette, S.; Gurney, S.; Dahal, S.; Carbonez, P.; Damet, J.; Lowe, C.; Marfo, E.; Ramyar, M.; Sheeja, J.S.; Baer, K.; Tredinnick, S.; Woodfield, T.; Kirkbride, T.; Palmer, D.; Schleich, N.
Source
In: Proceedings of SPIE - The International Society for Optical Engineering , Developments in X-Ray Tomography XII. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 11113)
Subject
Language
English
ISSN
1996756X
0277786X
0277786X