학술논문

A first test of CUPID prototypal light detectors with NTD-Ge sensors in a pulse-tube cryostat
Document Type
Article
Author
Alfonso, K.Camilleri, J.O'Donnell, T.Sharma, V.Armatol, A.Baudin, D.Berest, V.Ferri, F.Gras, P.Khalife, H.Lefevre, M.Mas, P.Nones, C.Schmidt, B.Zolotarova, A.Augier, C.Billard, J.De Jesus, M.Gascon, J.Juillard, A.Avignone, F.Creswick, R.Rosenfeld, C.Wilson, J.Wilson, K.Azzolini, O.Keppel, G.Pira, C.Tsymbaliuk, A.Balata, M.Benato, G.Bucci, C.Cappelli, L.Celi, E.D'Addabbo, A.Di Lorenzo, S.Fu, S.Ghislandi, S.Gorla, P.Guillaumon, P.Helis, D.Marini, L.Nisi, S.Olmi, M.Pagliarone, C.Pagnanini, L.Pattavina, L.Pirro, S.Puiu, A.Quitadamo, S.Tretyak, V.Barabash, A.Konovalov, S.Umatov, V.Bari, G.Boldrini, V.Mancarella, F.Rizzoli, R.Zucchelli, S.Barresi, A.Biassoni, M.Branca, A.Brofferio, C.Capelli, S.Carniti, P.Chiesa, D.Clemenza, M.Cremonesi, O.Dell'Oro, S.Faverzani, M.Ferri, E.Giachero, A.Gianvecchio, A.Girola, M.Gironi, L.Gotti, C.Nastasi, M.Nutini, I.Pavan, M.Pessina, G.Pozzi, S.Previtali, E.Sisti, M.Bellini, F.Cardani, L.Casali, N.Colantoni, I.Cruciani, A.D'Imperio, G.Dafinei, I.Dompé, V.Fantini, G.Milana, S.Morganti, S.Pettinacci, V.Polischuk, O.Ressa, A.Tomei, C.Beretta, M.Hansen, E.Kolomensky, Y.Norman, E.Singh, V.Vetter, K.Wagaarachchi, S.Welliver, B.Bettelli, M.Campani, A.Copello, S.Di Domizio, S.Capelli, C.Drobizhev, A.Fujikawa, B.Mei, Y.Ferroni, F.Chang, C.Novosad, V.Wang, G.Yefremenko, V.Zhang, J.Craft, E.Heeger, K.Langford, T.Liu, R.Maruyama, R.Nikkel, J.Pagan, S.Ponce, I.Slocum, P.Surukuchi, P.Torres, J.Dabagov, S.Foggetta, L.Franceschi, A.Mazzitelli, G.Napolitano, T.Danevich, F.Kobychev, V.Zarytskyy, M.de Marcillac, P.Dixon, T.Dumoulin, L.Gallas, A.Giuliani, A.Imbert, L.Loaiza, P.Madhukuttan, M.Marnieros, S.Olivieri, E.Poda, D.Rosier, P.Scarpaci, J.Figueroa-Feliciano, E.Formaggio, J.Johnston, J.Mayer, D.Ouellet, J.Winslow, L.Fu, C.Huang, H.Ma, L.Yan, L.Grant, C.Gutierrez, T.Han, K.Karapetrov, G.Kowalski, R.Speller, D.Wang, R.Liu, Y.Wang, L.Martinez, M.Peng, H.Xue, M.Yang, J.Shlegel, V.Taffarello, L.Velazquez, M.
Source
In: Journal of Instrumentation. (Journal of Instrumentation, 1 June 2023, 18(6))
Subject
Language
English
ISSN
17480221