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Observation of broad triangular Frank-type stacking faults and characterization of stacking faults with emission wavelengths below 430 nm in 4H-SiC epitaxial layers

Document Type

Article

Author

Na, M.; Bahng, W.; Jung, H.; Oh, C.; Jang, D.; Hong, S.-K.

Source

In: Applied Physics Letters. (Applied Physics Letters, 8 April 2024, 124(15))

Subject

Language

English

ISSN

00036951

Online Access

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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