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Comparative study: AutoDPR-SEM for enhancing CNN reliability in SRAM-based FPGAs through autonomous reconfiguration

Document Type

Article

Author

Tian, H.; Ibrahim, Y.; Wang, Y.; Jin, C.; Chen, L.; Chen, R.; Belev, G.

Source

In: Microelectronics Reliability. (Microelectronics Reliability, June 2024, 157)

Subject

Language

English

ISSN

00262714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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