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Single Atomic Defect Conductivity for Selective Dilute Impurity Imaging in 2D Semiconductors

Document Type

Article

Author

Vu, N.T.T.; Loh, L.; Verzhbitskiy, I.A.; Eda, G.; Bosman, M.; Trushin, M.; Chen, Y.; Wu, Q.; Ang, Y.S.; Ang, L.K.; Watanabe, K.; Taniguchi, T.

Source

In: ACS Nano. (ACS Nano, 22 August 2023, 17(16):15648-15655)

Subject

Language

English

ISSN

1936086X
19360851

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

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