학술논문
An improved methodology for high-resolution LA-ICP-MS trace-element fingerprinting of tephra layers: Insights from the Upper and Lower Nariokotome Tuffs, Turkana Basin, Kenya
Document Type
Article
Author
Source
In: Chemical Geology . (Chemical Geology, 20 August 2024, 660)
Subject
Language
English
ISSN
00092541