학술논문
Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology
Document Type
Article
Author
Bugiel, S.; Dorokhov, A.; Baudot, J.; Besson, A.; Bugiel, R.; Colledani, C.; Bitar, Z.E.; Goffe, M.; Hu-Guo, C.; Jaaskelainen, K.; Pham, H.; Senyukov, S.; Valin, I.; Wu, Y.; Cecconi, L.; Deng, W.; Di Mauro, A.; Hasenbichler, J.; Hong, G.H.; Kluge, A.; Mager, M.; de Melo, J.; Munker, M.; Piro, F.; Reidt, F.; Rinella, G.A.; Snoeys, W.; Suljic, M.; Sarritzu, V.; Usai, G.; Aresti, M.; Marras, D.; Winter, M.; Russo, R.; Beole, S.
Source
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment . (Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1 October 2022, 1040)
Subject
Language
English
ISSN
01689002