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Nanoelectrical monitoring the nonvolatile behavior of VO2 under multi-field stimulate by conductive atomic force microscopy

Document Type

Article

Author

Xu, X.; Wang, L.; Li, S.; Cui, A.; Deng, M.; Hou, Z.; Jiang, K.; Zhu, L.; Shang, L.; Chu, J.; Hu, Z.

Source

In: Materials Letters. (Materials Letters, 15 May 2024, 363)

Subject

Language

English

ISSN

18734979
0167577X

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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