학술논문
Experimental and modelling investigation of the influence of noise transit time and self-heating on microwave noise of Si/SiGe:C and InP/InGaAs HBTs
Document Type
Article
Source
In: Semiconductor Science and Technology . (Semiconductor Science and Technology, June 2012, 27(6))
Subject
Language
English
ISSN
02681242
13616641
13616641