학술논문
Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV Curve and Complex Admittance Measurements
Document Type
Article
Author
Zhou, Y.; Ambarish, C.V.; Gruenke, R.; Jaeckel, F.T.; Kripps, K.L.; McCammon, D.; Morgan, K.M.; Wulf, D.; Zhang, S.; Adams, J.S.; Bandler, S.R.; Chervenak, J.A.; Datesman, A.M.; Eckart, M.E.; Ewin, A.J.; Finkbeiner, F.M.; Kelley, R.L.; Kilbourne, C.A.; Miniussi, A.R.; Porter, F.S.; Sadleir, J.E.; Sakai, K.; Smith, S.J.; Wakeham, N.A.; Wassell, E.J.; Yoon, W.
Source
In: Journal of Low Temperature Physics . (Journal of Low Temperature Physics, 1 November 2018, 193(3-4):321-327)
Subject
Language
English
ISSN
15737357
00222291
00222291