학술논문
Initial In-Flight Error Rates for 16-MB SRAM as Flying on the Double Asteroid Redirection Test (DART) Mission
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):426-433 Apr, 2023
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
In-flight static random access memory (SRAM) single bit error (SBE) rates are compared to a series of rate prediction methods in an effort to demonstrate methods for uncertainty propagation and reduction. Supplier ground test data are statistically processed via Monte Carlo methods and considering detailed 3-D spacecraft-level geometries. In-flight rates are considered for the UT8R4M39 SRAM flying in NASA’s Double Asteroid Redirection Test (DART) spacecraft avionics single board computer (SBC) prior to impacting the asteroid Dimorphos.